{"id":13491,"date":"2023-08-18T09:14:36","date_gmt":"2023-08-18T07:14:36","guid":{"rendered":"https:\/\/trioptics.com\/us\/?page_id=13491"},"modified":"2024-04-23T12:49:41","modified_gmt":"2024-04-23T10:49:41","slug":"optisurf-pro-ar-waveguide-testing","status":"publish","type":"page","link":"https:\/\/trioptics.com\/us\/products\/optisurf-pro-ar-waveguide-testing\/","title":{"rendered":"OptiSurf PRO AR"},"content":{"rendered":"

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Applications<\/span><\/a><\/div>
Software<\/span><\/a><\/div>
Technical Data<\/span><\/a><\/div>
Knowledge Base<\/span><\/a><\/div>
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\"Downloads<\/span><\/div>

OptiSurf\u00ae<\/sup> PRO AR Brochure<\/h2><\/div>

Precise testing of waveguide stacking<\/p>\n<\/div>

Download<\/a><\/p>\n<\/div>

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OptiSurf\u00ae<\/sup> PRO AR<\/h1><\/div>

Testing geometrical properties of AR waveguide stacks and plano-optical elements<\/h2><\/div>

OptiSurf\u00ae<\/sup> PRO AR is a measurement device for characterizing geometrical properties of single waveguides and other plano-optical elements and as well as stacks of waveguides.\u00a0Stacked waveguides consist of two or three elements and the tilting of the individual elements relative to each other can cause unwanted color errors. The \u00ae<\/sup> PRO AR accurately measures this tilt. The focus of the interest here is the tilt of the single elements of the waveguide relative to each other or to a mechanical reference.\u00a0Another important application is the measurement of the total thickness variation (TTV) over the area of the waveguide as too much thickness variation will severely reduce the contrast (MTF) of the generated image<\/p>\n

Whether you’re in manufacturing, research, or quality control of waveguide stacks or optical elements, the system enables measurements of individual center thickness and air gaps between components in a stack with sub-micron precision. It also analyzes tilt, surface shape and bow directly in the software.<\/p>\n<\/div>

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Unique<\/h2><\/div>
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The OptiSurf\u00ae<\/sup> PRO AR enables accurate and reliable testing of geometric properties. It is the only measurement device on the market that can accurately measure the tilt of the individual elements of stacked waveguides relative to each other.<\/p>\n<\/div><\/div><\/div>

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Accuracy<\/h2><\/div>
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The OptiSurf\u00ae<\/sup> PRO AR is designed to provide you with accurate measurement data about e.g. total thickness variation (TTV), flatness and bow of single waveguides or plano-optical elements, as well as the alignment (e.g. tilt and air gap distance) of waveguides in a stack. This is done with the highest accuracy in a non-destructive measurement process.<\/p>\n<\/div><\/div><\/div>

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Experience<\/h2><\/div>
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TRIOPTICS has many years of experience in the non-contact measurement of the center thicknesses of single lenses and plane optics as well as for the measurement of air distances in optical systems with Optisurf\u00ae<\/sup>\u00a0product portfolio.<\/div><\/div><\/div>
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Applications<\/h2><\/div>
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The main measurement applications of the OptiSurf\u00ae<\/sup> PRO AR are the following:<\/h4><\/div>
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