{"id":255,"date":"2018-12-13T02:45:23","date_gmt":"2018-12-13T01:45:23","guid":{"rendered":"https:\/\/trioptics.com\/?page_id=255"},"modified":"2024-04-24T09:22:47","modified_gmt":"2024-04-24T07:22:47","slug":"wavemaster-wavefront-measurement-shack-hartmann","status":"publish","type":"page","link":"https:\/\/trioptics.com\/products\/wavemaster-wavefront-measurement-shack-hartmann\/","title":{"rendered":"WaveMaster"},"content":{"rendered":"

Product Overview<\/span><\/a><\/div>
Software<\/span><\/a><\/div>
Technical Data<\/span><\/a><\/div>
Upgrades & Accessories<\/span><\/a><\/div>
Knowledge Base<\/span><\/a><\/div>
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\"Downloads<\/span><\/div>

Product brochure<\/h2><\/div>

WaveSensor & WaveMaster\u00ae Brochure
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Brochure: WaveMaster\u00ae IOL 2
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WaveSensor & WaveMaster\u00ae<\/sup><\/h1><\/div>

Shack-Hartmann wavefront sensors<\/h2><\/div>

To ensure the implementation of the complex optical designs after production, a qualified measuring technology must be used. Wavefront measurement is particularly well-suited for this purpose, since it determines the image quality on a spatially-resolved basis, i.e. over all field angles, and across the entire sample aperture. In contrast to traditional MTF testing, this not only results in a point-based measure of quality, but also in a continuous alignment across the entire aperture.<\/p>\n<\/div>

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High flexibility<\/h2><\/div>
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With a maximum dynamic range of up to 2000 \u03bb, WaveSensor and WaveMaster\u00ae<\/sup> allow high flexibility in the lens design to be measured.<\/p>\n<\/div><\/div><\/div>

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Repeatable high precision<\/h2><\/div>
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In addition to a measuring accuracy of up to \u03bb\/20 (RMS), a high repeatability of \u03bb\/200 (RMS) can also be achieved due to the compact, robust and vibration-resistant design.<\/p>\n<\/div><\/div><\/div>

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Immediate evaluation<\/h2><\/div>
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In real time, the results of the measured wavefront data are compared and evaluated with those of the sample lenses or the design values.<\/p>\n<\/div><\/div><\/div>

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Product Overview<\/h2><\/div>

These sensors analyze entire optical arrangements or individual surfaces in real time, delivering the determination of the wavefront (PV, RMS), the Zernike coefficients, the Point Spread Function (PSF), the Modulation Transfer Function (MTF), the Strehl ratio, the radius of curvature and the aspherical coefficients. They thereby enable conclusions to be drawn not only about quality control, but also about the production process.<\/p>\n<\/div>

<\/i><\/i><\/span>More...<\/span><\/a><\/h4><\/div>
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WaveSensor represents the foundation of wavefront measurement and analysis of spherical, aspherical, freely shaped and flats single lenses and lens systems at TRIOPTICS. It involves a Shack-Hartmann sensor that is used both individually as well as integrated in complete measurement systems.<\/p>\n

As a result of their simple operation and flexibility, the measurement systems of the WaveMaster\u00ae<\/sup>\u00a0Compact series and the WaveMaster\u00ae<\/sup>\u00a0Plan, with its multiple degrees of freedom, are optimized for use in research and development and the random sample quality testing of single lenses. Analyses are performed over the surface and\/or the entire optical assembly.<\/p>\n

With the WaveMaster\u00ae<\/sup>\u00a0PRO\u00a02, TRIOPTICS offers a measurement system that is optimized for use in production and offers batch measurements. For applications where mere on-axis wavefront measurements are not sufficient because high field angles are not taken into account, WaveMaster\u00ae<\/sup>\u00a0Filed and WaveMaster\u00ae<\/sup>\u00a0UST offer solutions.<\/p>\n<\/div><\/div><\/div><\/div><\/div>

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WaveMaster\u00ae<\/sup> PRO 2 \/ PRO 2 Wafer \/
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Serial testing of lens and wafers<\/h3><\/div>
\"WaveMaster\u00ae<\/span><\/div><\/div>

WaveMaster\u00ae\u00a0<\/sup>PRO\u00a02 is used for series testing of lens assemblies and optical wafers<\/p>\n<\/div>