WaveSensor & WaveMaster®
Shack-Hartmann wavefront sensors
High flexibillity
Repeatable high precision
Immediate evaluation
Products
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WaveMaster® PRO 2 / PRO 2 Wafer / PRO 2 PLAN
Serial testing of lens and wafers
WaveMaster® PRO 2 is used for series testing of lens assemblies and optical wafers.
- Fully automatic measurement of high sample volumes (wafers or loaded trays)
- Measurement time of less than 3 seconds per lens and measurement step provides for high sample throughput
- High repeatability
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WaveMaster® Field
Off-axis wavefront measurement
The WaveMaster® Field is designed for testing single lenses and objectives under high field angles.
- Universal wavefront inspection at field angles of up to 60°
- Flexible and simple adjustment of individual angles of incidence and wavelengths
- Variable sample holder allows adaptation to different sample types – ideal for R&D
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Software
WaveSensor or WaveMaster® Software
The software is comprehensively structured, user friendly and includes all of the functions required to measure and analyze spherical and aspherical samples with a WaveSensor® or WaveMaster®. As a result of their flexible configurability, all important measurement results are displayed.
The software communicates with the Shack-Hartmann sensor and analyzes the measured wavefront in real time. In addition, the WaveMaster® controls measurement systems in order to align samples, for example.
- Clear, menu-guided and configurable operation
- Simple and intuitive measurement and analysis of wavefronts of the entire lens assembly or on surfaces in real time
- One software for everything: Data acquisition, data calculation, calibration and display of data
- Absolute and relative measurement mode for instant comparison with the theoretical design data from ZEMAX and Code V or with a reference lens
- Complete documentation through output of measurement certificates
- Clear depiction in adjustable measurement and analysis range of
- 2D wavefront
- PV and RMS
- Intensity
- Camera image
- Complete depiction of surface topography through multiple parameterizations:
- Aspherical equation
- Zernike polynomials
- Conical equation
- Spherical equation
- Free-form surface

Upgrades

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