Contact

WaveSensor  & WaveMaster® 

Shack-Hartmann wavefront sensors

To ensure the implementation of the complex optical designs after production, a qualified measuring technology must be used. Wavefront measurement is particularly well-suited for this purpose, since it determines the image quality on a spatially-resolved basis, i.e. over all field angles, and across the entire sample aperture. In contrast to traditional MTF testing, this not only results in a point-based measure of quality, but also in a continuous alignment across the entire aperture.

High flexibillity

With a maximum dynamic range of up to 2000 λ, WaveSensor and WaveMaster® allow high flexibility in the lens design to be measured.

Repeatable high precision

In addition to a measuring accuracy of up to λ/20 (RMS), a high repeatability of λ/200 (RMS) can also be achieved due to the compact, robust and vibration-resistant design.

Immediate evaluation

In real time, the results of the measured wavefront data are compared and evaluated with those of the sample lenses or the design values.

Products

These sensors analyze entire optical arrangements or individual surfaces in real time, delivering the determination of the wavefront (PV, RMS), the Zernike coefficients, the Point Spread Function (PSF), the Modulation Transfer Function (MTF), the Strehl ratio, the radius of curvature and the aspherical coefficients. They thereby enable conclusions to be drawn not only about quality control, but also about the production process.
WaveMaster® PRO 2 / PRO 2 Wafer / PRO 2 PLAN

WaveMaster® PRO 2 / PRO 2 Wafer / PRO 2 PLAN

Serial testing of lens and wafers

WaveMaster® PRO 2 is used for series testing of lens assemblies and optical wafers.

  • Fully automatic measurement of high sample volumes (wafers or loaded trays)
  • Measurement time of less than 3 seconds per lens and measurement step provides for high sample throughput
  • High repeatability
WaveMaster® Field

WaveMaster® Field

Off-axis wavefront measurement

The WaveMaster® Field is designed for testing single lenses and objectives under high field angles.

  • Universal wavefront inspection at field angles of up to 60°
  • Flexible and simple adjustment of individual angles of incidence and wavelengths
  • Variable sample holder allows adaptation to different sample types – ideal for R&D
back to top

Downloads

previous next
back to top

Software

WaveSensor or WaveMaster® Software

The software is comprehensively structured, user friendly and includes all of the functions required to measure and analyze spherical and aspherical samples with a WaveSensor® or WaveMaster®. As a result of their flexible configurability, all important measurement results are displayed.

The software communicates with the Shack-Hartmann sensor and analyzes the measured wavefront in real time. In addition, the WaveMaster® controls measurement systems in order to align samples, for example.

  • Clear, menu-guided and configurable operation
  • Simple and intuitive measurement and analysis of wavefronts of the entire lens assembly or on surfaces in real time
  • One software for everything: Data acquisition, data calculation, calibration and display of data
  • Absolute and relative measurement mode for instant comparison with the theoretical design data from ZEMAX and Code V or with a reference lens
  • Complete documentation through output of measurement certificates
  • Clear depiction in adjustable measurement and analysis range of
    • 2D wavefront
    • PV and RMS
    • Intensity
    • Camera image
  • Complete depiction of surface topography through multiple parameterizations:
    • Aspherical equation
    • Zernike polynomials
    • Conical equation
    • Spherical equation
    • Free-form surface
WaveMaster® Software
back to top

Upgrades

All of the WaveMaster® systems feature a flexible design and can thus be adapted to the specific requirements of your application.

A complete analysis is possible by an individual adjustment to the sample. Kinematic mounts enable the simple exchange of light sources and telescopes.

  • Light sources with different wavelength and numerical aperture
  • Telescopes for achieving optimal magnification between sample and sensor
  • Lens assemblies for surfaces with different radii of curvature
  • Sample holders and trays
  • Reference samples

back to top

WaveMaster® PRO 2

WaveMaster® Product request

Are you interested in a product and would like to receive a quote?

Whether you need advice or already have specific requirements, we will be happy to help you!

Use our contact form and get quick feedback from our experts.

Contact us

Personal Information

Salutation

Your inquiry

* = mandatory field, please complete

Our Newsletter – Your advantage in knowledge

Be one of the first to experience our product novelties and innovative application possibilities.

Register for the newsletter