OptiSurf® PRO AR is a measurement device for characterizing geometrical properties of single waveguides and other plano-optical elements and as well as stacks of waveguides. Stacked waveguides consist of two or three elements and the tilting of the individual elements relative to each other can cause unwanted color errors. The ® PRO AR accurately measures this tilt. The focus of the interest here is the tilt of the single elements of the waveguide relative to each other or to a mechanical reference. Another important application is the measurement of the total thickness variation (TTV) over the area of the waveguide as too much thickness variation will severely reduce the contrast (MTF) of the generated image
Whether you’re in manufacturing, research, or quality control of waveguide stacks or optical elements, the system enables measurements of individual center thickness and air gaps between components in a stack with sub-micron precision. It also analyzes tilt, surface shape and bow directly in the software.