OptiSurf® PRO AR
Testing geometrical properties of AR waveguide stacks and plano-optical elements
OptiSurf® PRO AR is a measurement device for characterizing geometrical properties of single waveguides and other plano-optical elements and as well as stacks of waveguides. Stacked waveguides consist of two or three elements and the tilting of the individual elements relative to each other can cause unwanted color errors. The ® PRO AR accurately measures this tilt. The focus of the interest here is the tilt of the single elements of the waveguide relative to each other or to a mechanical reference. Another important application is the measurement of the total thickness variation (TTV) over the area of the waveguide as too much thickness variation will severely reduce the contrast (MTF) of the generated image
Whether you’re in manufacturing, research, or quality control of waveguide stacks or optical elements, the system enables measurements of individual center thickness and air gaps between components in a stack with sub-micron precision. It also analyzes tilt, surface shape and bow directly in the software.
Unique
The OptiSurf® PRO AR enables accurate and reliable testing of geometric properties. It is the only measurement device on the market that can accurately measure the tilt of the individual elements of stacked waveguides relative to each other.
Accuracy
The OptiSurf® PRO AR is designed to provide you with accurate measurement data about e.g. total thickness variation (TTV), flatness and bow of single waveguides or plano-optical elements, as well as the alignment (e.g. tilt and air gap distance) of waveguides in a stack. This is done with the highest accuracy in a non-destructive measurement process.
Experience
Applications
The main measurement applications of the OptiSurf® PRO AR are the following:
Factors affecting image quality:
Software
OptiAngle® 6 and OptiSurf®
Technical Data
| Parameter | OptiSurf®PRO AR |
|---|---|
| Machine dimensions (h x w x d) | 1,900 mm x 860 mm x 860 mm |
| Sample dimensions (h x w x d) | Max 200 mm x 200 mm, height max 100 mm |
| Sample weight | Max 5 kg |
| Low coherence interferometer Measurement range Accuracy Measurement wavelength Measurement time | Up to 200 mm optical path Up to 0.15 μm* 1,310 nm 1.4 s per 10 mm scanning range |
| Motorized X/Y sample tray Yaw pitch error | 225 mm x 225 mm 10 arcsec over 100 mm |
| Device under test | Waveguide, VR Lens, Stacked waveguide, Planar optics |
*2σ for the measurement of 100 mm air gap between optical surfaces
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